IEEE-RS French Chapter organizes a seminar on Software Reliability : Paris, September 5, 2013

On September 5, the French Chapter of the IEEE-RS organizes a one-day seminar on the subject « Software Reliability in 2013 : theory and practice ». The seminar will consist of a few talks delivered by distinguished speakers invited by the IEEE-RS and presentations by « problem owners » from industry, with a panel session. One of the speakers will be Dr.Samuel Keene, inventor of the Keene model now described in RIAC-217. A workshop on how to form IEEE Reliability Society Chapters and co-sponsor student and industry outreach events will be conducted by Marsha Abramo, IEEE-RS VP Membership.

Venue: ALSTOM Headquarters, ‘Immeuble Le Sextant’, 3 Avenue André Malraux, Levallois-Perret , France (close Paris suburb).

For information please contact : Dr. Frédérique Vallée, President, IEEE-RS French Chapter, Email: frederique.vallee@all4tec.net, Telephone: +33 6 81 68 92 92 or Dr. Pierre Dersin, Ad Com, IEEE-RS, Email : pierre.dersin@transport.alstom.com, Telephone : + 33 6 83 66 51 14. Please consult the IEEE-RS Web Site for program details and logistic information. Access is free and no advanced registration is required but, for organization reasons, prospective attendees are requested to send a mail to Dr. Vallée or Dr.Dersin with their name and affiliation, stating their intention to attend.